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PS50 - Advanced Compact

NANOVEA INDIA PRIVATE LIMITEDBangalore, KA
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Anchored to the MCA registerCIN U31900KA2021FTC149162
Price on request. Ask the factory for a quote.
MOQ not stated Lead time on requestCurrency INR
Key attributesAll specs
Category
Profilometers
Place of origin
Bangalore, KA, India

High-Precision 3D Profilometers for Surface Characterization

NANOVEA 3D Profilometers provide high-precision surface characterization for roughness measurement, texture analysis, and step height evaluation. Using advanced Chromatic Light technology, our non-contact profilometers deliver repeatable, high-resolution surface metrology across coatings, semiconductors, medical devices, and aerospace materials.

Non-contact 3D surface profilometry for any material

  • Measures roughness, waviness, and step heights with sub-nanometer precision
  • Used in quality control, research, and failure analysis

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NANOVEA INDIA PRIVATE LIMITED
Unverified<1 yr on BharatSealBangalore, Karnataka
Year founded
2004

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