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Continuous Galvanizing | Galvalume Lines Measurement System

Continuous Galvanizing | Galvalume Lines Measurement System

Jasch Gauging Technologies LimitedNew Delhi, DL
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Anchored to the MCA registerCIN L33111DL2021PLC381513
Price on request. Ask the factory for a quote.
MOQ not declared by manufacturerLead time not declared by manufacturerCurrency INR
Key attributesAll specs
Place of origin
New Delhi, DL, India
Source
Oxford X-Ray Source
Detector
Ion Chamber
Substrate
Steel, 0.120 to 4.0 mm
Scanner Type
O-Frame

Key attributes

Place of originNew Delhi, DL, India
SourceOxford X-Ray Source
DetectorIon Chamber
SubstrateSteel, 0.120 to 4.0 mm
Scanner TypeO-Frame
Measuring Gap40 mm
Sampling Time20 milliseconds
SpecificationDetails
Measurement AreaApprox. 35 mm diameter
Initial Warm Up TimeApprox. 20 minutes from cold start
Standardization TimeApprox. 20 seconds after shutter is opened
Measurement PrincipleX-Ray Backscatter and Fluorescence
Overall Integration Time200 milliseconds to 2 seconds
Number Of Measuring HeadsTwo — one top and one bottom side
Standardization FrequencyRecommended after every 8 hours, performed automatically

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Jasch Gauging Technologies Limited
Not claimed<1 yr on BharatSealNew Delhi, Delhi
Year founded
1998

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